166 lines
5.9 KiB
C
166 lines
5.9 KiB
C
/******************************************************************************
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* Copyright (c) 2009 - 2021 Xilinx, Inc. All rights reserved.
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* SPDX-License-Identifier: MIT
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******************************************************************************/
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/*****************************************************************************/
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/**
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*
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* @file xil_testmem.h
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* @addtogroup common_test_utils Test Utilities for Memory and Caches
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*
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* - Cache test: xil_testcache.h contains utility functions to test cache.
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*
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* - I/O test: The Xil_testio.h file contains endian related memory IO functions. A
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* subset of the memory tests can be selected or all of the tests can be run in order.
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* If there is an error detected by a subtest, the test stops and the failure code is
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* returned. Further tests are not run even if all of the tests are selected.
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*
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* - Memory test: The xil_testmem.h file contains utility functions to test memory.
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* A subset of the memory tests can be selected or all of the tests can be run
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* in order. If there is an error detected by a subtest, the test stops and the
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* failure code is returned. Further tests are not run even if all of the tests are selected.
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*
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*
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* Following list describes the supported memory tests:
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*
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* - XIL_TESTMEM_ALLMEMTESTS: This test runs all of the subtests.
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*
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* - XIL_TESTMEM_INCREMENT: This test
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* starts at 'XIL_TESTMEM_INIT_VALUE' and uses the incrementing value as the
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* test value for memory.
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*
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* - XIL_TESTMEM_WALKONES: Also known as the Walking ones test. This test
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* uses a walking '1' as the test value for memory.
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* @code
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* location 1 = 0x00000001
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* location 2 = 0x00000002
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* ...
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* @endcode
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*
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* - XIL_TESTMEM_WALKZEROS: Also known as the Walking zero's test.
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* This test uses the inverse value of the walking ones test
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* as the test value for memory.
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* @code
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* location 1 = 0xFFFFFFFE
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* location 2 = 0xFFFFFFFD
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* ...
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*@endcode
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*
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* - XIL_TESTMEM_INVERSEADDR: Also known as the inverse address test.
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* This test uses the inverse of the address of the location under test
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* as the test value for memory.
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*
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* - XIL_TESTMEM_FIXEDPATTERN: Also known as the fixed pattern test.
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* This test uses the provided patters as the test value for memory.
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* If zero is provided as the pattern the test uses '0xDEADBEEF".
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*
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* @warning
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* The tests are <b>DESTRUCTIVE</b>. Run before any initialized memory spaces
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* have been set up.
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* The address provided to the memory tests is not checked for
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* validity except for the NULL case. It is possible to provide a code-space
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* pointer for this test to start with and ultimately destroy executable code
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* causing random failures.
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*
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* @note
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* Used for spaces where the address range of the region is smaller than
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* the data width. If the memory range is greater than 2 ** width,
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* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
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* repeat on a boundary of a power of two making it more difficult to detect
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* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
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* tests suffer the same problem. Ideally, if large blocks of memory are to be
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* tested, break them up into smaller regions of memory to allow the test
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* patterns used not to repeat over the region tested.
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*
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* <pre>
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* MODIFICATION HISTORY:
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*
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* Ver Who Date Changes
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* ----- ---- -------- -----------------------------------------------
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* 1.00a hbm 08/25/09 First release
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* 7.5 mus 03/10/21 Added new set of Xil_TestMem32, Xil_TestMem16 and
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* Xil_TestMem8 APIs to support memory test for memory
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* regions mapped at extended addresses
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* (addresses > 4 GB). These new set of APIs would be
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* compiled only for 32 bit Microblaze processor, if
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* XPAR_MICROBLAZE_ADDR_SIZE is greater than 32.
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* It fixes CR#1089129.
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* </pre>
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*
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******************************************************************************/
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/**
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*@cond nocomments
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*/
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#ifndef XIL_TESTMEM_H /* prevent circular inclusions */
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#define XIL_TESTMEM_H /* by using protection macros */
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#ifdef __cplusplus
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extern "C" {
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#endif
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/***************************** Include Files *********************************/
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#include "xil_types.h"
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#include "xparameters.h"
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/************************** Constant Definitions *****************************/
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/**************************** Type Definitions *******************************/
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/* xutil_memtest defines */
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#define XIL_TESTMEM_INIT_VALUE 1U
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/** @name Memory subtests
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* @{
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*/
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/**
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* See the detailed description of the subtests in the file description.
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*/
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#define XIL_TESTMEM_ALLMEMTESTS 0x00U
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#define XIL_TESTMEM_INCREMENT 0x01U
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#define XIL_TESTMEM_WALKONES 0x02U
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#define XIL_TESTMEM_WALKZEROS 0x03U
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#define XIL_TESTMEM_INVERSEADDR 0x04U
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#define XIL_TESTMEM_FIXEDPATTERN 0x05U
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#define XIL_TESTMEM_MAXTEST XIL_TESTMEM_FIXEDPATTERN
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/* @} */
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#if !defined(__aarch64__) && !defined(__arch64__)
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#define NUM_OF_BITS_IN_BYTE 8U
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#define NUM_OF_BYTES_IN_HW 2U
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#define NUM_OF_BITS_IN_HW 16U
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#define NUM_OF_BYTES_IN_WORD 4U
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#define NUM_OF_BITS_IN_WORD 32U
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#endif
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/***************** Macros (Inline Functions) Definitions *********************/
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/**
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*@endcond
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*/
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/************************** Function Prototypes ******************************/
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/* xutil_testmem prototypes */
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#if defined(__MICROBLAZE__) && !defined(__arch64__) && (XPAR_MICROBLAZE_ADDR_SIZE > 32)
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extern s32 Xil_TestMem32(u32 AddrLow, u32 AddrHigh, u32 Words, u32 Pattern, u8 Subtest);
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extern s32 Xil_TestMem16(u32 AddrLow, u32 AddrHigh, u32 Words, u16 Pattern, u8 Subtest);
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extern s32 Xil_TestMem8(u32 AddrLow, u32 AddrHigh, u32 Words, u8 Pattern, u8 Subtest);
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#else
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extern s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest);
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extern s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest);
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extern s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest);
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#endif
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#ifdef __cplusplus
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}
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#endif
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#endif /* end of protection macro */
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/**
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* @} End of "addtogroup common_test_utils".
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*/
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