1576 lines
37 KiB
C
1576 lines
37 KiB
C
/******************************************************************************
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* Copyright (c) 2009 - 2022 Xilinx, Inc. All rights reserved.
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* SPDX-License-Identifier: MIT
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******************************************************************************/
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/*****************************************************************************/
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/**
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*
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* @file xil_testmem.c
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* @addtogroup common_test_utils
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*
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*
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* <pre>
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* MODIFICATION HISTORY:
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*
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* Ver Who Date Changes
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* ----- ---- -------- -----------------------------------------------
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* 1.00a hbm 08/25/09 First release
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* 7.5 mus 03/10/21 Added new set of Xil_TestMem32, Xil_TestMem16 and
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* Xil_TestMem8 APIs to support memory test for memory
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* regions mapped at extended addresses
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* (addresses > 4 GB). These new set of APIs would be
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* compiled only for 32 bit Microblaze processor, if
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* XPAR_MICROBLAZE_ADDR_SIZE is greater than 32.
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* It fixes CR#1089129.
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* 7.6 mus 07/29/21 Updated Xil_TestMem8 to fix issues reported by static
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* analysis tool. It fixes CR#1105956.
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* 7.7 sk 01/10/22 Remove commented macro to fix misra_c_2012_directive_4_4
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* violation.
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* 7.7 sk 01/10/22 Modify operands to fix misra_c_2012_rule_10_1 violation.
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* 7.7 sk 01/10/22 Typecast to make the both left and right sides expressions
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* of same type and fix misra_c_2012_rule_10_6 violation.
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* 7.7 sk 01/10/22 Modify varaiable name from I to i to fix misra_c_2012_rule_
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* 21_2 violation.
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* 7.7 sk 01/10/22 Remove arithematic operations on pointer varaible to fix
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* misra_c_2012_rule_18_4 violation.
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* </pre>
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*
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*****************************************************************************/
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/***************************** Include Files ********************************/
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#include "xil_testmem.h"
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#include "xil_io.h"
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#include "xil_assert.h"
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/************************** Constant Definitions ****************************/
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/************************** Function Prototypes *****************************/
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static u32 RotateLeft(u32 Input, u8 Width);
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/* define ROTATE_RIGHT to give access to this functionality */
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#ifdef ROTATE_RIGHT
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static u32 RotateRight(u32 Input, u8 Width);
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#endif /* ROTATE_RIGHT */
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#if defined(__MICROBLAZE__) && !defined(__arch64__) && (XPAR_MICROBLAZE_ADDR_SIZE > 32)
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/*****************************************************************************/
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/**
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*
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* @brief Perform a destructive 8-bit wide memory test.
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*
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* @param Addrlow: lower 32 bit address of memory to be tested.
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* @param Addrhigh: upper 32 bit address of memory to be tested.
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* @param Words: length of the block.
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* @param Pattern: constant used for the constant pattern test, if 0,
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* 0xDEADBEEF is used.
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* @param Subtest: type of test selected. See xil_testmem.h for possible
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* values.
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*
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* @return
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* - -1 is returned for a failure
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* - 0 is returned for a pass
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*
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* @note
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* Used for spaces where the address range of the region is smaller than
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* the data width. If the memory range is greater than 2 ** Width,
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* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
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* repeat on a boundary of a power of two making it more difficult to detect
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* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
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* tests suffer the same problem. Ideally, if large blocks of memory are to be
|
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* tested, break them up into smaller regions of memory to allow the test
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* patterns used not to repeat over the region tested.
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*
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*****************************************************************************/
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s32 Xil_TestMem8(u32 Addrlow, u32 Addrhigh, u32 Words, u8 Pattern, u8 Subtest)
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{
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u32 I;
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u32 j;
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u8 Val;
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u8 WordMem8;
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s32 Status = 0;
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u64 Addr = (Addrlow + ((u64)Addrhigh << 32));
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Xil_AssertNonvoid(Words != (u32)0);
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Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
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/*
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* variable initialization
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*/
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Val = XIL_TESTMEM_INIT_VALUE;
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/*
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* select the proper Subtest(s)
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*/
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if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
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/*
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* Fill the memory with incrementing
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* values starting from XIL_TESTMEM_INIT_VALUE
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*/
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for (I = 0U; I < Words; I++) {
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/* write memory location */
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sbea(Addr+I, Val);
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Val++;
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}
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/*
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* Restore the reference 'Val' to the
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* initial value
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*/
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Val = XIL_TESTMEM_INIT_VALUE;
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/*
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* Check every word within the words
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* of tested memory and compare it
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* with the incrementing reference
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* Val
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*/
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for (I = 0U; I < Words; I++) {
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/* read memory location */
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WordMem8 = lbuea(Addr+I);
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if (WordMem8 != Val) {
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Status = -1;
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goto End_Label;
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}
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Val++;
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}
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}
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if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
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/*
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* set up to cycle through all possible initial
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* test Patterns for walking ones test
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*/
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for (j = 0U; j < NUM_OF_BITS_IN_BYTE; j++) {
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/*
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* Generate an initial value for walking ones test
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* to test for bad data bits
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*/
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Val = (u8)((u32)1 << j);
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/*
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* START walking ones test
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* Write a one to each data bit indifferent locations
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*/
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for (I = 0U; I < NUM_OF_BITS_IN_BYTE; I++) {
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/* write memory location */
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sbea(Addr+I, Val);
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Val = (u8)RotateLeft(Val, 8U);
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}
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/*
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* Restore the reference 'Val' to the
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* initial value
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*/
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Val = (u8)((u32)1 << j);
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/* Read the values from each location that was written */
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for (I = 0U; I < NUM_OF_BITS_IN_BYTE; I++) {
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/* read memory location */
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WordMem8 = lbuea(Addr+I);
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if (WordMem8 != Val) {
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Status = -1;
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goto End_Label;
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}
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Val = (u8)RotateLeft(Val, NUM_OF_BITS_IN_BYTE);
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}
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}
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}
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if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
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/*
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* set up to cycle through all possible initial test
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* Patterns for walking zeros test
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*/
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for (j = 0U; j < NUM_OF_BITS_IN_BYTE; j++) {
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/*
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* Generate an initial value for walking ones test to test
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* for bad data bits
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*/
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Val = (u8) (~(1U << j));
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/*
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* START walking zeros test
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* Write a one to each data bit indifferent locations
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*/
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for (I = 0U; I < NUM_OF_BITS_IN_BYTE; I++) {
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/* write memory location */
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sbea(Addr+I, Val);
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Val = ~((u8)RotateLeft(~Val, NUM_OF_BITS_IN_BYTE));
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}
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/*
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* Restore the reference 'Val' to the
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* initial value
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*/
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Val = (u8) (~(1U << j));
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/* Read the values from each location that was written */
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for (I = 0U; I < NUM_OF_BITS_IN_BYTE; I++) {
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/* read memory location */
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WordMem8 = lbuea(Addr+I);
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if (WordMem8 != Val) {
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Status = -1;
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goto End_Label;
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}
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Val = ~((u8)RotateLeft(~Val, NUM_OF_BITS_IN_BYTE));
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}
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}
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}
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if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
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/* Fill the memory with inverse of address */
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for (I = 0U; I < Words; I++) {
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/* write memory location */
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Val = (u8) (~((INTPTR) (Addr + I)));
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sbea(Addr+I, Val);
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}
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/*
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* Check every word within the words
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* of tested memory
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*/
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for (I = 0U; I < Words; I++) {
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/* read memory location */
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WordMem8 = lbuea(Addr+I);
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Val = (u8) (~((INTPTR) (Addr+I)));
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if ((WordMem8 ^ Val) != 0x00U) {
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Status = -1;
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goto End_Label;
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}
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}
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}
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if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
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/*
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* Generate an initial value for
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* memory testing
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*/
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if (Pattern == (u8)0) {
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Val = 0xA5U;
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}
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else {
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Val = Pattern;
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}
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/*
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* Fill the memory with fixed Pattern
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*/
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for (I = 0U; I < Words; I++) {
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/* write memory location */
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sbea(Addr+I, Val);
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}
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/*
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* Check every word within the words
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* of tested memory and compare it
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* with the fixed Pattern
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*/
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for (I = 0U; I < Words; I++) {
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/* read memory location */
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WordMem8 = lbuea(Addr+I);
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if (WordMem8 != Val) {
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Status = -1;
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goto End_Label;
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}
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}
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}
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End_Label:
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return Status;
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}
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/*****************************************************************************/
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/**
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*
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* @brief Perform a destructive 16-bit wide memory test.
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|
*
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|
* @param Addrlow: lower 32 bit address of memory to be tested.
|
|
* @param Addrhigh: upper 32 bit address of memory to be tested.
|
|
* @param Words: length of the block.
|
|
* @param Pattern: constant used for the constant Pattern test, if 0,
|
|
* 0xDEADBEEF is used.
|
|
* @param Subtest: type of test selected. See xil_testmem.h for possible
|
|
* values.
|
|
*
|
|
* @return
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|
*
|
|
* - -1 is returned for a failure
|
|
* - 0 is returned for a pass
|
|
*
|
|
* @note
|
|
* Used for spaces where the address range of the region is smaller than
|
|
* the data width. If the memory range is greater than 2 ** Width,
|
|
* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
|
|
* repeat on a boundary of a power of two making it more difficult to detect
|
|
* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
|
|
* tests suffer the same problem. Ideally, if large blocks of memory are to be
|
|
* tested, break them up into smaller regions of memory to allow the test
|
|
* patterns used not to repeat over the region tested.
|
|
*
|
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*****************************************************************************/
|
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s32 Xil_TestMem16(u32 Addrlow,u32 Addrhigh, u32 Words, u16 Pattern, u8 Subtest)
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{
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u32 I;
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u32 j;
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u16 Val;
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u16 WordMem16;
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s32 Status = 0;
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u64 Addr = (Addrlow + ((u64)Addrhigh << 32));
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Xil_AssertNonvoid(Words != (u32)0);
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Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
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|
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/*
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* variable initialization
|
|
*/
|
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Val = XIL_TESTMEM_INIT_VALUE;
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|
|
|
/*
|
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* selectthe proper Subtest(s)
|
|
*/
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
|
|
/*
|
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* Fill the memory with incrementing
|
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* values starting from 'XIL_TESTMEM_INIT_VALUE'
|
|
*/
|
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for (I = 0U; I < (NUM_OF_BYTES_IN_HW * Words);) {
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/* write memory location */
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shea(Addr+I, Val);
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Val++;
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I = I + NUM_OF_BYTES_IN_HW;
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}
|
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|
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/*
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* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
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Val = XIL_TESTMEM_INIT_VALUE;
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
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* with the incrementing reference val
|
|
*/
|
|
|
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for (I = 0U; I < (NUM_OF_BYTES_IN_HW * Words);) {
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/* read memory location */
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WordMem16 = lhuea(Addr+I);
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if (WordMem16 != Val) {
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Status = -1;
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goto End_Label;
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}
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Val++;
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I = I + NUM_OF_BYTES_IN_HW;
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}
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}
|
|
|
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if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
|
|
/*
|
|
* set up to cycle through all possible initial test
|
|
* Patterns for walking ones test
|
|
*/
|
|
|
|
for (j = 0U; j < NUM_OF_BITS_IN_HW; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones test
|
|
* to test for bad data bits
|
|
*/
|
|
|
|
Val = (u16)((u32)1 << j);
|
|
/*
|
|
* START walking ones test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_HW * NUM_OF_BITS_IN_HW); ) {
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/* write memory location */
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shea(Addr+I,Val);
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Val = (u16)RotateLeft(Val, 16U);
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I = I + NUM_OF_BYTES_IN_HW;
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}
|
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/*
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* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
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Val = (u16)((u32)1 << j);
|
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/* Read the values from each location that was written */
|
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for (I = 0U; I < (NUM_OF_BYTES_IN_HW * NUM_OF_BITS_IN_HW); ) {
|
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/* read memory location */
|
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WordMem16 = lhuea(Addr+I);
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if (WordMem16 != Val) {
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Status = -1;
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goto End_Label;
|
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}
|
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Val = (u16)RotateLeft(Val, NUM_OF_BITS_IN_HW);
|
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I = I + NUM_OF_BYTES_IN_HW;
|
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}
|
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}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
|
|
/*
|
|
* set up to cycle through all possible initial
|
|
* test Patterns for walking zeros test
|
|
*/
|
|
|
|
for (j = 0U; j < NUM_OF_BITS_IN_HW; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones
|
|
* test to test for bad
|
|
* data bits
|
|
*/
|
|
|
|
Val = ~(1U << j);
|
|
/*
|
|
* START walking zeros test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_HW * NUM_OF_BITS_IN_HW);) {
|
|
shea(Addr+I, Val);
|
|
Val = ~((u16)RotateLeft(~Val, 16U));
|
|
I = I + NUM_OF_BYTES_IN_HW;
|
|
}
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = ~(1U << j);
|
|
/* Read the values from each location that was written */
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_HW * NUM_OF_BITS_IN_HW); ) {
|
|
WordMem16= lhuea(Addr+I);
|
|
if (WordMem16 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val = ~((u16)RotateLeft(~Val, NUM_OF_BITS_IN_HW));
|
|
I = I + NUM_OF_BYTES_IN_HW;
|
|
}
|
|
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
|
|
/* Fill the memory with inverse of address */
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_HW * Words);) {
|
|
/* write memory location */
|
|
Val = (u16) (~((INTPTR)((Addr+I))));
|
|
shea(Addr+I, Val);
|
|
I = I + NUM_OF_BYTES_IN_HW;
|
|
}
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_HW*Words); ) {
|
|
/* read memory location */
|
|
WordMem16 = lhuea(Addr+I);
|
|
Val = (u16) (~((INTPTR) ((Addr+I))));
|
|
if ((WordMem16 ^ Val) != 0x0000U) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
I = I + NUM_OF_BYTES_IN_HW;
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
|
|
/*
|
|
* Generate an initial value for
|
|
* memory testing
|
|
*/
|
|
if (Pattern == (u16)0) {
|
|
Val = 0xDEADU;
|
|
}
|
|
else {
|
|
Val = Pattern;
|
|
}
|
|
|
|
/*
|
|
* Fill the memory with fixed pattern
|
|
*/
|
|
|
|
for (I = 0U; I < (2*Words);) {
|
|
/* write memory location */
|
|
shea(Addr+I, Val);
|
|
I = I + NUM_OF_BYTES_IN_HW;
|
|
}
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the fixed pattern
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_HW * Words);) {
|
|
/* read memory location */
|
|
WordMem16=lhuea(Addr+I);
|
|
if (WordMem16 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
I = I + NUM_OF_BYTES_IN_HW;
|
|
}
|
|
}
|
|
End_Label:
|
|
return Status;
|
|
}
|
|
|
|
/*****************************************************************************/
|
|
/**
|
|
*
|
|
* @brief Perform a destructive 32-bit wide memory test.
|
|
*
|
|
* @param Addrlow: lower 32 bit address of memory to be tested.
|
|
* @param Addrhigh: upper 32 bit address of memory to be tested.
|
|
* @param Words: length of the block.
|
|
* @param Pattern: constant used for the constant pattern test, if 0,
|
|
* 0xDEADBEEF is used.
|
|
* @param Subtest: test type selected. See xil_testmem.h for possible
|
|
* values.
|
|
*
|
|
* @return
|
|
* - 0 is returned for a pass
|
|
* - 1 is returned for a failure
|
|
*
|
|
* @note
|
|
* Used for spaces where the address range of the region is smaller than
|
|
* the data width. If the memory range is greater than 2 ** Width,
|
|
* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
|
|
* repeat on a boundary of a power of two making it more difficult to detect
|
|
* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
|
|
* tests suffer the same problem. Ideally, if large blocks of memory are to be
|
|
* tested, break them up into smaller regions of memory to allow the test
|
|
* patterns used not to repeat over the region tested.
|
|
*
|
|
*****************************************************************************/
|
|
s32 Xil_TestMem32(u32 Addrlow, u32 Addrhigh, u32 Words, u32 Pattern, u8 Subtest)
|
|
{
|
|
u32 I;
|
|
u32 j;
|
|
u32 Val;
|
|
u32 WordMem32;
|
|
s32 Status = 0;
|
|
u64 Addr = (Addrlow + ((u64)Addrhigh << 32));
|
|
|
|
Xil_AssertNonvoid(Words != (u32)0);
|
|
Xil_AssertNonvoid(Subtest <= (u8)XIL_TESTMEM_MAXTEST);
|
|
|
|
/*
|
|
* variable initialization
|
|
*/
|
|
Val = XIL_TESTMEM_INIT_VALUE;
|
|
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
|
|
/*
|
|
* Fill the memory with incrementing
|
|
* values starting from 'XIL_TESTMEM_INIT_VALUE'
|
|
*/
|
|
for (I = 0U; I <(NUM_OF_BYTES_IN_WORD * Words);) {
|
|
swea(Addr+I, Val);
|
|
Val++;
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = XIL_TESTMEM_INIT_VALUE;
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the incrementing reference
|
|
* Val
|
|
*/
|
|
|
|
for (I = 0U; I < ( NUM_OF_BYTES_IN_WORD * Words);) {
|
|
WordMem32 = lwea(Addr+I);
|
|
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
|
|
Val++;
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
|
|
/*
|
|
* set up to cycle through all possible initial
|
|
* test Patterns for walking ones test
|
|
*/
|
|
|
|
for (j = 0U; j < NUM_OF_BITS_IN_WORD; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones test
|
|
* to test for bad data bits
|
|
*/
|
|
|
|
Val = (1U << j);
|
|
|
|
/*
|
|
* START walking ones test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_WORD * NUM_OF_BITS_IN_WORD);) {
|
|
/* write memory location */
|
|
swea(Addr+I, Val);
|
|
Val = (u32) RotateLeft(Val, NUM_OF_BITS_IN_WORD);
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
|
|
/*
|
|
* Restore the reference 'val' to the
|
|
* initial value
|
|
*/
|
|
Val = 1U << j;
|
|
|
|
/* Read the values from each location that was
|
|
* written */
|
|
for (I = 0U; I < ((u32)32 * NUM_OF_BYTES_IN_WORD);) {
|
|
/* read memory location */
|
|
|
|
WordMem32 = lwea(Addr+I);
|
|
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
|
|
Val = (u32)RotateLeft(Val, NUM_OF_BITS_IN_WORD);
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
|
|
/*
|
|
* set up to cycle through all possible
|
|
* initial test Patterns for walking zeros test
|
|
*/
|
|
|
|
for (j = 0U; j < NUM_OF_BITS_IN_WORD; j++) {
|
|
|
|
/*
|
|
* Generate an initial value for walking ones test
|
|
* to test for bad data bits
|
|
*/
|
|
|
|
Val = ~(1U << j);
|
|
|
|
/*
|
|
* START walking zeros test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BITS_IN_WORD * NUM_OF_BYTES_IN_WORD);) {
|
|
/* write memory location */
|
|
swea(Addr+I, Val);
|
|
Val = ~((u32)RotateLeft(~Val, NUM_OF_BITS_IN_WORD));
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
|
|
Val = ~(1U << j);
|
|
|
|
/* Read the values from each location that was
|
|
* written */
|
|
for (I = 0U; I < (NUM_OF_BITS_IN_WORD * NUM_OF_BYTES_IN_WORD);) {
|
|
/* read memory location */
|
|
WordMem32 = lwea(Addr+I);
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val = ~((u32)RotateLeft(~Val, NUM_OF_BITS_IN_WORD));
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
|
|
/* Fill the memory with inverse of address */
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_WORD * Words);) {
|
|
/* write memory location */
|
|
Val = (u32) (~((INTPTR) (Addr+I)));
|
|
swea(Addr+I, Val);
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_WORD * Words);) {
|
|
/* Read the location */
|
|
WordMem32 = lwea(Addr+I);
|
|
Val = (u32) (~((INTPTR) (Addr+I)));
|
|
|
|
if ((WordMem32 ^ Val) != 0x00000000U) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
|
|
/*
|
|
* Generate an initial value for
|
|
* memory testing
|
|
*/
|
|
|
|
if (Pattern == (u32)0) {
|
|
Val = 0xDEADBEEFU;
|
|
}
|
|
else {
|
|
Val = Pattern;
|
|
}
|
|
|
|
/*
|
|
* Fill the memory with fixed Pattern
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_WORD * Words);) {
|
|
/* write memory location */
|
|
swea(Addr+I, Val);
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the fixed Pattern
|
|
*/
|
|
|
|
for (I = 0U; I < (NUM_OF_BYTES_IN_WORD * Words);) {
|
|
|
|
/* read memory location */
|
|
|
|
WordMem32 = lwea(Addr+I);
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
I = I + NUM_OF_BYTES_IN_WORD;
|
|
}
|
|
}
|
|
|
|
End_Label:
|
|
return Status;
|
|
}
|
|
|
|
#else
|
|
/*****************************************************************************/
|
|
/**
|
|
*
|
|
* @brief Perform a destructive 32-bit wide memory test.
|
|
*
|
|
* @param Addr: pointer to the region of memory to be tested.
|
|
* @param Words: length of the block.
|
|
* @param Pattern: constant used for the constant pattern test, if 0,
|
|
* 0xDEADBEEF is used.
|
|
* @param Subtest: test type selected. See xil_testmem.h for possible
|
|
* values.
|
|
*
|
|
* @return
|
|
* - 0 is returned for a pass
|
|
* - 1 is returned for a failure
|
|
*
|
|
* @note
|
|
* Used for spaces where the address range of the region is smaller than
|
|
* the data width. If the memory range is greater than 2 ** Width,
|
|
* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
|
|
* repeat on a boundary of a power of two making it more difficult to detect
|
|
* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
|
|
* tests suffer the same problem. Ideally, if large blocks of memory are to be
|
|
* tested, break them up into smaller regions of memory to allow the test
|
|
* patterns used not to repeat over the region tested.
|
|
*
|
|
*****************************************************************************/
|
|
s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest)
|
|
{
|
|
u32 i;
|
|
u32 j;
|
|
u32 Val;
|
|
u32 FirtVal;
|
|
u32 WordMem32;
|
|
s32 Status = 0;
|
|
|
|
Xil_AssertNonvoid(Words != (u32)0);
|
|
Xil_AssertNonvoid(Subtest <= (u8)XIL_TESTMEM_MAXTEST);
|
|
|
|
/*
|
|
* variable initialization
|
|
*/
|
|
Val = XIL_TESTMEM_INIT_VALUE;
|
|
FirtVal = XIL_TESTMEM_INIT_VALUE;
|
|
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
|
|
/*
|
|
* Fill the memory with incrementing
|
|
* values starting from 'FirtVal'
|
|
*/
|
|
for (i = 0U; i < Words; i++) {
|
|
Addr[i] = Val;
|
|
Val++;
|
|
}
|
|
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = FirtVal;
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the incrementing reference
|
|
* Val
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
WordMem32 = Addr[i];
|
|
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
|
|
Val++;
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
|
|
/*
|
|
* set up to cycle through all possible initial
|
|
* test Patterns for walking ones test
|
|
*/
|
|
|
|
for (j = 0U; j < (u32)32; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones test
|
|
* to test for bad data bits
|
|
*/
|
|
|
|
Val = (1UL << j);
|
|
|
|
/*
|
|
* START walking ones test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (i = 0U; i < (u32)32; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val = (u32) RotateLeft(Val, 32U);
|
|
}
|
|
|
|
/*
|
|
* Restore the reference 'val' to the
|
|
* initial value
|
|
*/
|
|
Val = 1UL << j;
|
|
|
|
/* Read the values from each location that was
|
|
* written */
|
|
for (i = 0U; i < (u32)32; i++) {
|
|
/* read memory location */
|
|
|
|
WordMem32 = Addr[i];
|
|
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
|
|
Val = (u32)RotateLeft(Val, 32U);
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
|
|
/*
|
|
* set up to cycle through all possible
|
|
* initial test Patterns for walking zeros test
|
|
*/
|
|
|
|
for (j = 0U; j < (u32)32; j++) {
|
|
|
|
/*
|
|
* Generate an initial value for walking ones test
|
|
* to test for bad data bits
|
|
*/
|
|
|
|
Val = ~(1UL << j);
|
|
|
|
/*
|
|
* START walking zeros test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (i = 0U; i < (u32)32; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val = ~((u32)RotateLeft(~Val, 32U));
|
|
}
|
|
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
|
|
Val = ~(1UL << j);
|
|
|
|
/* Read the values from each location that was
|
|
* written */
|
|
for (i = 0U; i < (u32)32; i++) {
|
|
/* read memory location */
|
|
WordMem32 = Addr[i];
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val = ~((u32)RotateLeft(~Val, 32U));
|
|
}
|
|
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
|
|
/* Fill the memory with inverse of address */
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Val = ~(u32) (UINTPTR) &Addr[i];
|
|
Addr[i] = Val;
|
|
}
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* Read the location */
|
|
WordMem32 = Addr[i];
|
|
Val = ~(u32) (UINTPTR) &Addr[i];
|
|
|
|
if ((WordMem32 ^ Val) != 0x00000000U) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
|
|
/*
|
|
* Generate an initial value for
|
|
* memory testing
|
|
*/
|
|
|
|
if (Pattern == (u32)0) {
|
|
Val = 0xDEADBEEFU;
|
|
}
|
|
else {
|
|
Val = Pattern;
|
|
}
|
|
|
|
/*
|
|
* Fill the memory with fixed Pattern
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
}
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the fixed Pattern
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
|
|
/* read memory location */
|
|
|
|
WordMem32 = Addr[i];
|
|
if (WordMem32 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
}
|
|
}
|
|
|
|
End_Label:
|
|
return Status;
|
|
}
|
|
|
|
/*****************************************************************************/
|
|
/**
|
|
*
|
|
* @brief Perform a destructive 16-bit wide memory test.
|
|
*
|
|
* @param Addr: pointer to the region of memory to be tested.
|
|
* @param Words: length of the block.
|
|
* @param Pattern: constant used for the constant Pattern test, if 0,
|
|
* 0xDEADBEEF is used.
|
|
* @param Subtest: type of test selected. See xil_testmem.h for possible
|
|
* values.
|
|
*
|
|
* @return
|
|
*
|
|
* - -1 is returned for a failure
|
|
* - 0 is returned for a pass
|
|
*
|
|
* @note Used for spaces where the address range of the region is smaller than
|
|
* the data width. If the memory range is greater than 2 ** Width,
|
|
* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
|
|
* repeat on a boundary of a power of two making it more difficult to detect
|
|
* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
|
|
* tests suffer the same problem. Ideally, if large blocks of memory are to be
|
|
* tested, break them up into smaller regions of memory to allow the test
|
|
* patterns used not to repeat over the region tested.
|
|
*
|
|
*****************************************************************************/
|
|
s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest)
|
|
{
|
|
u32 i;
|
|
u32 j;
|
|
u16 Val;
|
|
u16 FirtVal;
|
|
u16 WordMem16;
|
|
s32 Status = 0;
|
|
|
|
Xil_AssertNonvoid(Words != (u32)0);
|
|
Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
|
|
|
|
/*
|
|
* variable initialization
|
|
*/
|
|
Val = XIL_TESTMEM_INIT_VALUE;
|
|
FirtVal = XIL_TESTMEM_INIT_VALUE;
|
|
|
|
/*
|
|
* selectthe proper Subtest(s)
|
|
*/
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
|
|
/*
|
|
* Fill the memory with incrementing
|
|
* values starting from 'FirtVal'
|
|
*/
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val++;
|
|
}
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = FirtVal;
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the incrementing reference val
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* read memory location */
|
|
WordMem16 = Addr[i];
|
|
if (WordMem16 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val++;
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
|
|
/*
|
|
* set up to cycle through all possible initial test
|
|
* Patterns for walking ones test
|
|
*/
|
|
|
|
for (j = 0U; j < (u32)16; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones test
|
|
* to test for bad data bits
|
|
*/
|
|
|
|
Val = (u16)((u32)1 << j);
|
|
/*
|
|
* START walking ones test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (i = 0U; i < (u32)16; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val = (u16)RotateLeft(Val, 16U);
|
|
}
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = (u16)((u32)1 << j);
|
|
/* Read the values from each location that was written */
|
|
for (i = 0U; i < (u32)16; i++) {
|
|
/* read memory location */
|
|
WordMem16 = Addr[i];
|
|
if (WordMem16 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val = (u16)RotateLeft(Val, 16U);
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
|
|
/*
|
|
* set up to cycle through all possible initial
|
|
* test Patterns for walking zeros test
|
|
*/
|
|
|
|
for (j = 0U; j < (u32)16; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones
|
|
* test to test for bad
|
|
* data bits
|
|
*/
|
|
|
|
Val = (u16) (~((u16)1U << j));
|
|
/*
|
|
* START walking zeros test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
|
|
for (i = 0U; i < (u32)16; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val = ~((u16)RotateLeft(~((u32)Val), 16U));
|
|
}
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = (u16) (~((u16)1U << j));
|
|
/* Read the values from each location that was written */
|
|
for (i = 0U; i < (u32)16; i++) {
|
|
/* read memory location */
|
|
WordMem16 = Addr[i];
|
|
if (WordMem16 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val = ~((u16)RotateLeft(~((u32)Val), 16U));
|
|
}
|
|
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
|
|
/* Fill the memory with inverse of address */
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Val = ~(u16) (UINTPTR) &Addr[i];
|
|
Addr[i] = Val;
|
|
}
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* read memory location */
|
|
WordMem16 = Addr[i];
|
|
Val = ~(u16) (UINTPTR) &Addr[i];
|
|
if ((WordMem16 ^ Val) != 0x0000U) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
|
|
/*
|
|
* Generate an initial value for
|
|
* memory testing
|
|
*/
|
|
if (Pattern == (u16)0) {
|
|
Val = 0xDEADU;
|
|
}
|
|
else {
|
|
Val = Pattern;
|
|
}
|
|
|
|
/*
|
|
* Fill the memory with fixed pattern
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
}
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the fixed pattern
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* read memory location */
|
|
WordMem16 = Addr[i];
|
|
if (WordMem16 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
}
|
|
}
|
|
|
|
End_Label:
|
|
return Status;
|
|
}
|
|
|
|
|
|
/*****************************************************************************/
|
|
/**
|
|
*
|
|
* @brief Perform a destructive 8-bit wide memory test.
|
|
*
|
|
* @param Addr: pointer to the region of memory to be tested.
|
|
* @param Words: length of the block.
|
|
* @param Pattern: constant used for the constant pattern test, if 0,
|
|
* 0xDEADBEEF is used.
|
|
* @param Subtest: type of test selected. See xil_testmem.h for possible
|
|
* values.
|
|
*
|
|
* @return
|
|
* - -1 is returned for a failure
|
|
* - 0 is returned for a pass
|
|
*
|
|
* @note
|
|
* Used for spaces where the address range of the region is smaller than
|
|
* the data width. If the memory range is greater than 2 ** Width,
|
|
* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
|
|
* repeat on a boundary of a power of two making it more difficult to detect
|
|
* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
|
|
* tests suffer the same problem. Ideally, if large blocks of memory are to be
|
|
* tested, break them up into smaller regions of memory to allow the test
|
|
* patterns used not to repeat over the region tested.
|
|
*
|
|
*****************************************************************************/
|
|
s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest)
|
|
{
|
|
u32 i;
|
|
u32 j;
|
|
u8 Val;
|
|
u8 FirtVal;
|
|
u8 WordMem8;
|
|
s32 Status = 0;
|
|
|
|
Xil_AssertNonvoid(Words != (u32)0);
|
|
Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
|
|
|
|
/*
|
|
* variable initialization
|
|
*/
|
|
Val = XIL_TESTMEM_INIT_VALUE;
|
|
FirtVal = XIL_TESTMEM_INIT_VALUE;
|
|
|
|
/*
|
|
* select the proper Subtest(s)
|
|
*/
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
|
|
/*
|
|
* Fill the memory with incrementing
|
|
* values starting from 'FirtVal'
|
|
*/
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val++;
|
|
}
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = FirtVal;
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the incrementing reference
|
|
* Val
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* read memory location */
|
|
WordMem8 = Addr[i];
|
|
if (WordMem8 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val++;
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
|
|
/*
|
|
* set up to cycle through all possible initial
|
|
* test Patterns for walking ones test
|
|
*/
|
|
|
|
for (j = 0U; j < (u32)8; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones test
|
|
* to test for bad data bits
|
|
*/
|
|
Val = (u8)((u32)1 << j);
|
|
/*
|
|
* START walking ones test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
for (i = 0U; i < (u32)8; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val = (u8)RotateLeft(Val, 8U);
|
|
}
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = (u8)((u32)1 << j);
|
|
/* Read the values from each location that was written */
|
|
for (i = 0U; i < (u32)8; i++) {
|
|
/* read memory location */
|
|
WordMem8 = Addr[i];
|
|
if (WordMem8 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
Val = (u8)RotateLeft(Val, 8U);
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
|
|
/*
|
|
* set up to cycle through all possible initial test
|
|
* Patterns for walking zeros test
|
|
*/
|
|
|
|
for (j = 0U; j < (u32)8; j++) {
|
|
/*
|
|
* Generate an initial value for walking ones test to test
|
|
* for bad data bits
|
|
*/
|
|
Val = (u8) (~(1U << j));
|
|
/*
|
|
* START walking zeros test
|
|
* Write a one to each data bit indifferent locations
|
|
*/
|
|
for (i = 0U; i < (u32)8; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
Val = ~((u8)RotateLeft(~((u32)Val), 8U));
|
|
}
|
|
/*
|
|
* Restore the reference 'Val' to the
|
|
* initial value
|
|
*/
|
|
Val = (u8) (~(1U << j));
|
|
/* Read the values from each location that was written */
|
|
for (i = 0U; i < (u32)8; i++) {
|
|
/* read memory location */
|
|
WordMem8 = Addr[i];
|
|
if (WordMem8 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
|
|
Val = ~((u8)RotateLeft(~((u32)Val), 8U));
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
|
|
/* Fill the memory with inverse of address */
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Val = ~(u8) (UINTPTR) &Addr[i];
|
|
Addr[i] = Val;
|
|
}
|
|
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* read memory location */
|
|
WordMem8 = Addr[i];
|
|
Val = ~(u8) (UINTPTR) &Addr[i];
|
|
if ((WordMem8 ^ Val) != 0x00U) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
}
|
|
}
|
|
|
|
if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
|
|
/*
|
|
* Generate an initial value for
|
|
* memory testing
|
|
*/
|
|
|
|
if (Pattern == (u8)0) {
|
|
Val = 0xA5U;
|
|
}
|
|
else {
|
|
Val = Pattern;
|
|
}
|
|
/*
|
|
* Fill the memory with fixed Pattern
|
|
*/
|
|
for (i = 0U; i < Words; i++) {
|
|
/* write memory location */
|
|
Addr[i] = Val;
|
|
}
|
|
/*
|
|
* Check every word within the words
|
|
* of tested memory and compare it
|
|
* with the fixed Pattern
|
|
*/
|
|
|
|
for (i = 0U; i < Words; i++) {
|
|
/* read memory location */
|
|
WordMem8 = Addr[i];
|
|
if (WordMem8 != Val) {
|
|
Status = -1;
|
|
goto End_Label;
|
|
}
|
|
}
|
|
}
|
|
|
|
End_Label:
|
|
return Status;
|
|
}
|
|
#endif
|
|
|
|
/*****************************************************************************/
|
|
/**
|
|
*
|
|
* @brief Rotates the provided value to the left one bit position
|
|
*
|
|
* @param Input is value to be rotated to the left
|
|
* @param Width is the number of bits in the input data
|
|
*
|
|
* @return The resulting unsigned long value of the rotate left
|
|
*
|
|
*
|
|
*****************************************************************************/
|
|
static u32 RotateLeft(u32 Input, u8 Width)
|
|
{
|
|
u32 Msb;
|
|
u32 ReturnVal;
|
|
u32 WidthMask;
|
|
u32 MsbMask;
|
|
u32 LocalInput = Input;
|
|
|
|
/*
|
|
* set up the WidthMask and the MsbMask
|
|
*/
|
|
|
|
MsbMask = 1UL << (Width - 1U);
|
|
|
|
WidthMask = (MsbMask << (u32)1) - (u32)1;
|
|
|
|
/*
|
|
* set the Width of the Input to the correct width
|
|
*/
|
|
|
|
LocalInput = LocalInput & WidthMask;
|
|
|
|
Msb = LocalInput & MsbMask;
|
|
|
|
ReturnVal = LocalInput << 1U;
|
|
|
|
if (Msb != 0x00000000U) {
|
|
ReturnVal = ReturnVal | (u32)0x00000001;
|
|
}
|
|
|
|
ReturnVal = ReturnVal & WidthMask;
|
|
|
|
return ReturnVal;
|
|
|
|
}
|
|
|
|
#ifdef ROTATE_RIGHT
|
|
/*****************************************************************************/
|
|
/**
|
|
*
|
|
* @brief Rotates the provided value to the right one bit position
|
|
*
|
|
* @param Input: value to be rotated to the right
|
|
* @param Width: number of bits in the input data
|
|
*
|
|
* @return
|
|
* The resulting u32 value of the rotate right
|
|
*
|
|
*****************************************************************************/
|
|
static u32 RotateRight(u32 Input, u8 Width)
|
|
{
|
|
u32 Lsb;
|
|
u32 ReturnVal;
|
|
u32 WidthMask;
|
|
u32 MsbMask;
|
|
u32 LocalInput = Input;
|
|
/*
|
|
* set up the WidthMask and the MsbMask
|
|
*/
|
|
|
|
MsbMask = 1U << (Width - 1U);
|
|
|
|
WidthMask = (MsbMask << 1U) - 1U;
|
|
|
|
/*
|
|
* set the width of the input to the correct width
|
|
*/
|
|
|
|
LocalInput = LocalInput & WidthMask;
|
|
|
|
ReturnVal = LocalInput >> 1U;
|
|
|
|
Lsb = LocalInput & 0x00000001U;
|
|
|
|
if (Lsb != 0x00000000U) {
|
|
ReturnVal = ReturnVal | MsbMask;
|
|
}
|
|
|
|
ReturnVal = ReturnVal & WidthMask;
|
|
|
|
return ReturnVal;
|
|
|
|
}
|
|
#endif /* ROTATE_RIGHT */
|